Several types of imaging systems are used in nanotechnology, each with its own strengths and limitations:
- Scanning Electron Microscopy (SEM): Uses a focused beam of electrons to produce high-resolution images of the surface of a sample. SEM is widely used for its ability to provide detailed surface topography. - Transmission Electron Microscopy (TEM): Employs transmitted electrons to generate images of the internal structure of thin samples. TEM offers extremely high resolution and is useful for studying the internal composition of nanomaterials. - Atomic Force Microscopy (AFM): Utilizes a cantilever with a sharp tip to scan the surface of a sample. AFM can measure various forces and is capable of imaging, measuring, and manipulating materials at the nanoscale. - Scanning Tunneling Microscopy (STM): Based on the tunneling current between a sharp tip and the sample surface, STM provides atomic-scale resolution and is particularly useful for conductive materials.
