crystal structure

What Tools Are Used to Characterize Crystal Structure?

Several advanced tools and techniques are employed to characterize crystal structures at the nanoscale:
X-ray Diffraction (XRD): Determines the atomic and molecular structure by measuring the angles and intensities of diffracted X-rays.
Transmission Electron Microscopy (TEM): Provides high-resolution images of the crystal structure.
Scanning Tunneling Microscopy (STM): Offers atomic-level imaging of the surface structure.
Atomic Force Microscopy (AFM): Measures surface topography at the nanoscale.

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