Several advanced tools are used for atomic and molecular visualization:
Scanning Tunneling Microscope (STM): STM provides images of surfaces at the atomic level by measuring the tunneling current between a sharp tip and the surface. Atomic Force Microscope (AFM): AFM uses a cantilever with a sharp tip to scan the surface, measuring forces between the tip and the sample to create a topographical map. Transmission Electron Microscope (TEM): TEM uses a beam of electrons transmitted through a sample to create high-resolution images, allowing for the observation of atomic structures. Scanning Electron Microscope (SEM): SEM scans a focused electron beam over a surface to produce detailed images of the sample's topography and composition.
