Several advanced tools are employed to measure and characterize nanomaterials, including:
Scanning Electron Microscopy (SEM): Uses focused beams of electrons to produce high-resolution images of the surface topography of nanomaterials. Transmission Electron Microscopy (TEM): Passes electrons through a thin sample to obtain detailed images of internal structures at the atomic level. Atomic Force Microscopy (AFM): Measures surface topography by scanning a sharp probe over the sample's surface, providing 3D images. X-ray Diffraction (XRD): Determines the crystalline structure of nanomaterials by analyzing the pattern of X-rays diffracted by the sample. Dynamic Light Scattering (DLS): Measures particle size distribution in a solution by analyzing the scattering of light caused by particles.
