Several advanced tools are employed for measurement in nanotechnology: - Atomic Force Microscopy (AFM): Used to measure surface topography at the nanoscale. - Scanning Electron Microscopy (SEM): Provides high-resolution images of nanomaterials. - Transmission Electron Microscopy (TEM): Offers detailed internal structural information. - X-ray Diffraction (XRD): Used to determine crystal structure. - Dynamic Light Scattering (DLS): Measures particle size and distribution in colloidal systems.
