What Techniques Enable Simultaneous Data Acquisition?
Several advanced techniques facilitate the simultaneous collection of optical and topographical data:
Scanning Near-field Optical Microscopy (SNOM): Combines near-field optical techniques with atomic force microscopy to provide both optical and topographical data. Confocal Microscopy with Atomic Force Microscopy (AFM): This setup integrates confocal optical microscopy with AFM to achieve dual data acquisition. Raman-AFM: This method merges Raman spectroscopy with AFM, allowing the concurrent capture of vibrational spectra and surface topography.
