quality control (qc)

What Techniques are Used in QC for Nanotechnology?

Various advanced techniques are employed in QC for nanotechnology, including:
Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) for high-resolution imaging.
Atomic Force Microscopy (AFM) for surface topology and mechanical property measurements.
X-ray Diffraction (XRD) for crystal structure analysis.
Dynamic Light Scattering (DLS) for particle size distribution.
Spectroscopy techniques such as Raman and UV-Vis for chemical composition and optical properties.

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