What Techniques are Used in Nanostructure Analysis?
Several advanced techniques are employed in nanostructure analysis, each with its own advantages and limitations. Some of the most commonly used methods include:
- Transmission Electron Microscopy (TEM): TEM provides high-resolution images of nanostructures by transmitting a beam of electrons through a thin specimen. - Scanning Electron Microscopy (SEM): SEM scans the surface of a specimen with a focused beam of electrons to create detailed images of surface topography and composition. - Atomic Force Microscopy (AFM): AFM uses a cantilever with a sharp tip to scan the surface of a sample, providing topographical data at the nanoscale. - X-ray Diffraction (XRD): XRD analyzes the crystalline structure of materials by measuring the diffraction patterns of X-rays passing through the sample. - Raman Spectroscopy: This technique uses the scattering of monochromatic light to provide information about molecular vibrations, which can be used to identify molecular composition and structure.
