ex situ analysis

What Techniques are Used in Ex Situ Analysis?


Several techniques are commonly employed in ex situ analysis to characterize nanomaterials. These include:
Scanning Electron Microscopy (SEM): Provides detailed images of the surface morphology of nanomaterials.
Transmission Electron Microscopy (TEM): Offers high-resolution imaging and information on the internal structure of nanomaterials.
Atomic Force Microscopy (AFM): Measures surface topography and mechanical properties at the nanoscale.
X-ray Diffraction (XRD): Determines the crystalline structure and phase composition of nanomaterials.
Fourier Transform Infrared Spectroscopy (FTIR): Identifies chemical bonds and functional groups in nanomaterials.
Raman Spectroscopy: Provides information on molecular vibrations and chemical composition.

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