Several advanced techniques are employed in enhanced imaging, including:
Scanning Electron Microscopy (SEM): This technique uses focused beams of electrons to create detailed images of sample surfaces. Transmission Electron Microscopy (TEM): TEM passes electrons through a sample to provide high-resolution images of its internal structure. Atomic Force Microscopy (AFM): AFM uses a mechanical probe to scan the surface of a sample, providing topographical data at the nanoscale. Fluorescence Microscopy: This technique uses fluorescent markers to visualize specific components within a sample.
