What Techniques are Used for Size and Shape Characterization?
Transmission Electron Microscopy (TEM) and Scanning Electron Microscopy (SEM) are the most commonly used techniques for determining the size and shape of quantum dots. TEM provides high-resolution images that allow for precise measurement of nanocrystal dimensions, while SEM offers detailed surface morphology. Additionally, Atomic Force Microscopy (AFM) can be used to obtain three-dimensional profiles of quantum dots on a surface.
