quality control

What Techniques are Used for Quality Control?

Several advanced techniques are employed to ensure quality control in nanotechnology:
Atomic Force Microscopy (AFM): Used for surface characterization and measuring the mechanical properties of nanomaterials.
Scanning Electron Microscopy (SEM): Provides high-resolution images of nanostructures.
X-ray Diffraction (XRD): Used to identify crystalline structures and phase composition.
Dynamic Light Scattering (DLS): Measures the size distribution of nanoparticles in suspension.
Spectroscopy: Various forms, such as Raman and UV-Vis, are used for chemical analysis and material characterization.

Frequently asked queries:

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