What Techniques are Used for Nanotechnology Inspection?
A variety of techniques are employed for inspecting nanomaterials, each with its unique advantages and limitations:
Scanning Electron Microscopy (SEM): Utilizes a focused beam of electrons to create high-resolution images of the surface of nanomaterials. Transmission Electron Microscopy (TEM): Provides detailed images of the internal structure of nanomaterials by transmitting electrons through a thin sample. Atomic Force Microscopy (AFM): Uses a mechanical probe to map the surface topography of nanomaterials at very high resolution. X-ray Diffraction (XRD): Analyzes the crystalline structure of nanomaterials by measuring the diffraction patterns of X-rays. Raman Spectroscopy: Provides information about the molecular vibrations and composition of nanomaterials.
