nanotechnology detection

What Techniques are Used for Nanotechnology Detection?

Several advanced techniques are employed for detecting nanoparticles and nanostructures:
Scanning Electron Microscopy (SEM): Provides high-resolution images of nanostructures.
Transmission Electron Microscopy (TEM): Offers detailed internal structure images of nanoscale materials.
Atomic Force Microscopy (AFM): Enables 3D imaging and surface characterization at the nanoscale.
Dynamic Light Scattering (DLS): Measures the size distribution of nanoparticles in suspension.
X-ray Diffraction (XRD): Analyzes the crystallographic structure of nanomaterials.

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