Several advanced techniques are used for isotopic analysis in nanotechnology, including:
Mass Spectrometry: This technique measures the mass-to-charge ratio of ions to identify isotopes. Variants like Inductively Coupled Plasma Mass Spectrometry (ICP-MS) are highly sensitive and can detect isotopes at very low concentrations. Secondary Ion Mass Spectrometry (SIMS): SIMS involves bombarding the sample with a primary ion beam to sputter secondary ions, which are then analyzed to determine isotopic composition. This technique can provide spatially-resolved isotopic information, which is essential for studying nanostructures. Nuclear Magnetic Resonance (NMR): NMR can be used to study isotopic variations in nanomaterials, especially those containing isotopes with nuclear magnetic properties.
