What Techniques are Used for Inspections in Nanotechnology?
Several advanced techniques are employed to inspect nanomaterials and devices:
1. Scanning Electron Microscopy (SEM): SEM provides high-resolution images of nanostructures, allowing for detailed surface inspections. 2. Atomic Force Microscopy (AFM): AFM is used to measure surface roughness and topology at the nanoscale. 3. Transmission Electron Microscopy (TEM): TEM offers detailed images of the internal structure of nanomaterials. 4. X-ray Diffraction (XRD): XRD is used to determine the crystalline structure and composition of nanomaterials. 5. Raman Spectroscopy: This technique provides information about molecular vibrations, offering insights into the chemical composition of nanomaterials.
