inspection

What Techniques are Used for Inspection?

Several advanced techniques are used for inspection in nanotechnology:
- Scanning Electron Microscopy (SEM): Provides high-resolution images of the surface structure of nanomaterials.
- Transmission Electron Microscopy (TEM): Offers detailed internal structure visualization at atomic resolution.
- Atomic Force Microscopy (AFM): Measures surface topography at the nanoscale by scanning a sharp tip over the surface.
- X-ray Diffraction (XRD): Used for determining the crystalline structure of nanomaterials.
- Raman Spectroscopy: Analyzes vibrational modes of molecules to provide information about molecular composition and structure.

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