in situ monitoring

What Techniques are Used for In Situ Monitoring?

Several advanced techniques are employed for in situ monitoring in nanotechnology, including:
Scanning Electron Microscopy (SEM): Allows for high-resolution imaging of nanoscale structures in real time.
Transmission Electron Microscopy (TEM): Offers detailed images and information about the internal structure of nanoparticles.
Atomic Force Microscopy (AFM): Provides topographical data and mechanical properties of nanomaterials.
X-ray Diffraction (XRD): Used for analyzing the crystalline structure of nanomaterials during synthesis.
Raman Spectroscopy: Enables chemical characterization and identification of materials at the nanoscale.

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