What Techniques are Used for In Situ Measurements?
Several advanced techniques are employed for in situ measurements in nanotechnology, including:
Transmission Electron Microscopy (TEM): This technique allows for high-resolution imaging and analysis of nanomaterials under various environmental conditions. Scanning Probe Microscopy (SPM): SPM techniques, such as Atomic Force Microscopy (AFM), enable the observation of surface phenomena at the nanoscale. Raman Spectroscopy: This is used to study vibrational, rotational, and other low-frequency modes in a system, providing insights into molecular interactions. X-ray Diffraction (XRD): In situ XRD can be used to monitor the structural changes of nanomaterials under different environmental conditions. Nuclear Magnetic Resonance (NMR): NMR spectroscopy helps in studying the local structure and dynamics of nanomaterials.
