What Techniques are Used for Crystallographic Analysis?
Several advanced techniques are employed for crystallographic analysis in nanotechnology:
X-ray Diffraction (XRD): A non-destructive technique that reveals information about the crystal structure, phase, and other structural parameters. Transmission Electron Microscopy (TEM): Provides high-resolution images and can be used to study the crystal structure and defects at the atomic level. Scanning Electron Microscopy (SEM): Used for surface imaging and can also provide crystallographic information through techniques like electron backscatter diffraction (EBSD). Atomic Force Microscopy (AFM): Offers topographical data and can also provide information on crystallographic orientations.
