What Techniques are Commonly Used in Characterization Facilities?
Several techniques are commonly used in characterization facilities to analyze nanomaterials. These include:
- Electron Microscopy: Techniques like Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) provide high-resolution images of nanomaterials, revealing their morphology and structure. - Atomic Force Microscopy (AFM): AFM is used to measure surface topography at the nanoscale. It can also provide information about mechanical properties. - X-ray Diffraction (XRD): XRD is used to determine the crystalline structure of nanomaterials. - Spectroscopy: Techniques such as Raman spectroscopy and Fourier Transform Infrared (FTIR) spectroscopy are used to analyze the chemical composition and molecular structure of nanomaterials. - Dynamic Light Scattering (DLS): DLS measures the size distribution of nanoparticles in a solution.
