Several statistical methods are commonly employed in nanotechnology:
Descriptive Statistics: Includes measures such as mean, median, mode, and standard deviation to summarize data. Inferential Statistics: Techniques like hypothesis testing, confidence intervals, and regression analysis to draw conclusions from data samples. Multivariate Analysis: Methods such as principal component analysis (PCA) and cluster analysis to handle multiple variables simultaneously. Monte Carlo Simulations: Used to model the probability of different outcomes in processes that involve random variables.
