X-Ray Reflectometry (XRR) is a powerful analytical technique used to study the surface and interface properties of thin films and multilayers. By measuring the intensity of X-rays reflected from a material's surface, XRR provides valuable information on the film's thickness, density, and surface roughness. This non-destructive method is highly sensitive to changes in material composition at the nanometer scale, making it an indispensable tool in the field of Nanotechnology.
