What is Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS)?
Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is an analytical technique used to study the surface composition of materials. It is particularly useful in nanotechnology due to its ability to provide detailed information about the surface at the nanometer scale. TOF-SIMS works by bombarding a sample’s surface with a focused primary ion beam, causing the ejection of secondary ions. These ions are then analyzed based on their time of flight, which allows for the determination of their mass-to-charge ratios.
