Scanning Tunneling Microscopy (STM) is a powerful technique used to visualize and manipulate surfaces at the atomic level. Developed by Gerd Binnig and Heinrich Rohrer in 1981, STM has revolutionized the field of nanotechnology by providing unprecedented access to the atomic and molecular structures of materials. The technology uses a quantum mechanical phenomenon called quantum tunneling to measure the distance between a conductive tip and a sample surface.
