What is Scanning Tunneling Microscopy (STM) and how is it different from AFM?
STM is another powerful tool used to study the surfaces of materials at the atomic level. Unlike AFM, which measures forces, STM measures the electrical current that flows between a sharp tip and the sample when they are brought very close together. This current, known as tunneling current, is highly sensitive to the distance between the tip and the sample, enabling atomic-scale resolution. STM is particularly useful for studying conductive materials, whereas AFM can be used on both conductive and non-conductive materials.
