Rietveld refinement is a powerful computational technique used to extract detailed structural information from X-ray diffraction (XRD) and neutron diffraction data. Named after the Dutch scientist Hugo Rietveld, this method is particularly useful for characterizing crystalline materials. In the context of nanotechnology, Rietveld refinement is crucial for understanding the structural properties of nanomaterials, including atomic positions, phase compositions, and crystallite sizes.
