measurement sensitivity

What Instruments are Used for High-Sensitivity Measurements?

Several advanced instruments are used for high-sensitivity measurements in nanotechnology:
Atomic Force Microscopy (AFM): Provides high-resolution imaging and force measurements at the nanoscale.
Scanning Electron Microscopy (SEM): Offers detailed images of nanostructures and can detect minor changes in surface morphology.
Transmission Electron Microscopy (TEM): Allows for the visualization of internal structures at the atomic level.
Scanning Tunneling Microscopy (STM): Measures the tunneling current between a sharp tip and the sample to provide atomic-scale images.

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