complex experimental setup

What Characterization Tools are Essential?

Characterization tools provide detailed information about the nanomaterials. Some essential instruments include:
Scanning Electron Microscope (SEM): Provides high-resolution images of the surface morphology.
Atomic Force Microscope (AFM): Measures surface topography at the nanoscale using a mechanical probe.
Transmission Electron Microscope (TEM): Offers detailed internal structure images by transmitting electrons through the sample.
X-ray Diffraction (XRD): Used to determine the crystal structure and composition of nanomaterials.

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