surface metrology

What are the Techniques Used in Surface Metrology?

Several techniques are employed to measure and characterize surfaces in nanotechnology:
Atomic Force Microscopy (AFM): Provides high-resolution images by scanning a sharp probe over the surface.
Scanning Electron Microscopy (SEM): Uses focused beams of electrons to obtain surface topography and composition information.
Scanning Tunneling Microscopy (STM): Measures surface atoms by exploiting the quantum tunneling effect.
White Light Interferometry: Uses the interference of light waves to measure surface profiles with high precision.

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