AFMs can operate in several modes, each suited to different types of analysis:
Contact Mode: The tip is in constant contact with the sample surface. This mode is useful for measuring topography but can damage soft samples. Tapping Mode: The cantilever oscillates near its resonant frequency, intermittently touching the surface. This reduces damage to the sample and is suitable for soft or fragile materials. Non-Contact Mode: The tip hovers just above the sample surface, detecting van der Waals forces. This mode is ideal for imaging delicate samples without physical contact.
