Scanning Electron Microscopy (SEM)
SEM uses a focused beam of electrons to scan the surface of a sample, producing detailed images of its topography and composition. It is widely used for its high resolution and ability to analyze a variety of materials.
Transmission Electron Microscopy (TEM)
TEM involves transmitting electrons through a very thin sample. It provides detailed images of the internal structure of nanomaterials, enabling the study of their crystal structure and defects.
Atomic Force Microscopy (AFM)
AFM uses a cantilever with a sharp tip to scan the surface of a sample. The interactions between the tip and the sample surface are measured to create high-resolution images. AFM is particularly useful for imaging non-conductive materials.
Scanning Tunneling Microscopy (STM)
STM relies on the quantum tunneling of electrons between a sharp tip and the sample surface. It provides atomic-scale resolution and is used to study the electronic properties of materials.
Near-Field Scanning Optical Microscopy (NSOM)
NSOM combines optical and scanning probe techniques to achieve high-resolution imaging beyond the diffraction limit of light. It is used to study optical properties at the nanoscale.
X-ray Diffraction (XRD)
XRD analyzes the scattering of X-rays by the atomic planes in a crystal. It provides information about the crystal structure, phase composition, and crystallite size of nanomaterials.
Raman Spectroscopy
Raman spectroscopy measures the inelastic scattering of light by molecules or crystals. It is used to study the vibrational modes of nanomaterials, providing information about their chemical composition and structure.
