There are several types of analysis tools commonly used in nanotechnology, including:
1. Microscopy Techniques:
- Scanning Electron Microscopy (SEM): Provides high-resolution images of material surfaces by scanning them with an electron beam.
- Transmission Electron Microscopy (TEM): Offers detailed images of the internal structure of nanoscale materials by transmitting electrons through a thin sample.
- Atomic Force Microscopy (AFM): Measures surface topography with atomic-level resolution by scanning a probe over the sample surface.
2. Spectroscopy Techniques:
- Raman Spectroscopy: Analyzes vibrational, rotational, and other low-frequency modes in a system to provide a molecular fingerprint.
- X-ray Photoelectron Spectroscopy (XPS): Measures the elemental composition and chemical state of the materials by irradiating them with X-rays.
- Fourier Transform Infrared Spectroscopy (FTIR): Identifies organic, polymeric, and in some cases, inorganic materials by measuring their infrared absorption spectra.
3. Diffraction Techniques:
- X-ray Diffraction (XRD): Determines the crystallographic structure, phase identification, and other structural properties of materials by analyzing the diffraction pattern of X-rays scattered by the sample.
- Electron Diffraction: Used in conjunction with TEM to provide detailed information about the crystal structure of nanomaterials.
4. Surface Analysis Techniques:
- Scanning Tunneling Microscopy (STM): Provides atomic-scale images and allows manipulation of individual atoms on a surface by measuring the tunneling current between a sharp tip and the sample.
- Secondary Ion Mass Spectrometry (SIMS): Analyzes the composition of solid surfaces and thin films by sputtering the surface with a focused primary ion beam and then mass analyzing the ejected secondary ions.
