ion beam analysis

What are the Main Techniques of Ion Beam Analysis?

Several techniques fall under the umbrella of IBA, each with its specific applications and advantages:
Rutherford Backscattering Spectrometry (RBS): Measures the backscattering of ions to determine the composition and thickness of thin films.
Particle-Induced X-ray Emission (PIXE): Detects the characteristic X-rays emitted by atoms in the sample when struck by ions, useful for trace element analysis.
Nuclear Reaction Analysis (NRA): Utilizes nuclear reactions to analyze light elements like hydrogen and boron in materials.
Elastic Recoil Detection Analysis (ERDA): Provides depth profiles of elements by detecting recoiled atoms from the sample.

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