While XPS is a powerful tool, it has some limitations: - Surface Sensitivity: XPS is extremely surface-sensitive, typically analyzing the top 1-10 nm of a material. This can be a limitation if bulk properties are of interest. - Quantification: Quantitative analysis can be challenging due to the need for appropriate sensitivity factors and matrix effects. - Sample Preparation: Samples must be compatible with ultra-high vacuum conditions, which can be restrictive for certain types of nanomaterials.
