Despite its advantages, EELS has certain limitations:
Beam Damage: High-energy electrons can cause damage to sensitive nanomaterials, particularly organic and biological samples. Complex Data Interpretation: The spectra obtained from EELS can be complex and require sophisticated analysis techniques to extract meaningful information. Limited Sample Thickness: EELS analysis is typically limited to thin samples, as thicker samples can cause multiple scattering events that complicate the interpretation of the spectra.
