Several parameters are critical when characterizing nanoparticles:
Size: Measured using techniques like Dynamic Light Scattering (DLS) and Transmission Electron Microscopy (TEM). Shape: Determined through microscopy methods such as Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM). Surface Area: Quantified using techniques like Brunauer-Emmett-Teller (BET) analysis. Surface Charge: Often measured by zeta potential analysis. Composition: Analyzed using methods like X-ray Diffraction (XRD) and Energy Dispersive X-ray Spectroscopy (EDS).
