While both AFM and STM are used for imaging surfaces at the nanoscale, they operate on different principles. AFM measures mechanical forces between the tip and sample, making it suitable for both conducting and non-conducting samples. STM, on the other hand, relies on tunneling current and is mainly used for conducting or semiconducting materials. The choice between AFM and STM depends on the specific requirements of the research, such as the type of material and the desired information.
