1. Conductive AFM Tip: A sharp, conductive tip that interacts with the sample surface. 2. Piezoelectric Scanner: A device that moves the tip across the sample with high precision. 3. Lock-in Amplifier: Used to detect the small variations in the electrostatic force. 4. Feedback System: Maintains a constant distance between the tip and the sample. 5. Controller and Software: For data acquisition and analysis.
