Characterizing [nanomaterials](#) involves determining their physical and chemical properties to ensure they meet desired specifications. Common techniques include: - Transmission Electron Microscopy (TEM): Provides high-resolution images to study the internal structure. - Scanning Electron Microscopy (SEM): Used for surface imaging and particle size analysis. - X-Ray Diffraction (XRD): Determines crystalline structure and phase composition. - Dynamic Light Scattering (DLS): Measures particle size distribution in a liquid medium.
These techniques help in understanding the morphology, composition, and functional properties of the nanomaterials, which are critical for their intended applications.
