Several advanced techniques are employed to visualize nanostructures, including:
Scanning Electron Microscopy (SEM) SEM uses a focused beam of electrons to scan the surface of a sample. The interactions between the electrons and the atoms in the sample produce signals that are used to form high-resolution images. SEM is widely used to observe the surface morphology and composition of nanomaterials.
Transmission Electron Microscopy (TEM) TEM involves transmitting a beam of electrons through a thin sample. The electrons interact with the sample as they pass through, and the resulting image provides detailed information about the internal structure of the nanomaterial. TEM is essential for studying the crystal structure and defects in nanomaterials.
Atomic Force Microscopy (AFM) AFM uses a sharp probe to scan the surface of a sample. The interactions between the probe and the sample generate a topographical map, providing three-dimensional images with atomic resolution. AFM is particularly useful for measuring surface properties and mechanical characteristics of nanomaterials.
Scanning Tunneling Microscopy (STM) STM operates by scanning a conductive tip very close to the surface of a conductive or semiconductive sample. The tunneling current between the tip and the sample is measured to construct images of the atomic structure. STM allows for both imaging and manipulation of individual atoms and molecules.
Raman Spectroscopy Raman spectroscopy is a technique used to observe vibrational, rotational, and other low-frequency modes in a system. It provides molecular-level information about the chemical composition and structure of nanomaterials. This technique is invaluable for studying chemical bonds and interactions in nanomaterials.
