Several test methods are commonly used in nanotechnology, including:
Scanning Electron Microscopy (SEM) SEM is used to obtain high-resolution images of nanomaterials. It helps in observing the morphology and surface structure at the nanoscale. SEM can achieve magnifications of up to 1,000,000 times, providing detailed images of nanoscale features.
Transmission Electron Microscopy (TEM) TEM provides information about the internal structure of nanomaterials. It can reveal details about crystal structures, defects, and particle size. TEM requires ultra-thin samples and can achieve atomic-level resolution.
Atomic Force Microscopy (AFM) AFM is used to measure surface topography and mechanical properties. It involves scanning a sharp probe over the sample surface to generate a 3D image. AFM can also measure forces between the probe and sample, providing insights into mechanical behavior at the nanoscale.
X-ray Diffraction (XRD) XRD is used to determine the crystalline structure of nanomaterials. It involves measuring the diffraction patterns of X-rays interacting with the sample. XRD can provide information about lattice parameters, phase identification, and crystallite size.
Dynamic Light Scattering (DLS) DLS measures the size distribution of nanoparticles in a solution. It analyzes the scattering of light caused by particles in motion. DLS is a powerful tool for characterizing the hydrodynamic radius and polydispersity index of nanoparticles.
