nanocharacterization

What are the Common Techniques Used in Nanocharacterization?

Various techniques are used to analyze nanomaterials, each providing different types of information:
Transmission Electron Microscopy (TEM): Provides high-resolution images and information about the internal structure of nanomaterials.
Scanning Electron Microscopy (SEM): Offers detailed surface images and topographical information.
Atomic Force Microscopy (AFM): Measures surface roughness and can manipulate individual atoms and molecules.
X-ray Diffraction (XRD): Determines the crystalline structure and phase composition of nanomaterials.
Dynamic Light Scattering (DLS): Measures the size distribution of nanoparticles in a solution.
Raman Spectroscopy: Provides information about molecular vibrations, which can be used to identify molecular compositions and interactions.

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