nano characterization

What are the Common Techniques for Nano Characterization?

Microscopy Techniques
Electron microscopy, such as Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM), is widely used for high-resolution imaging of nanostructures. Atomic Force Microscopy (AFM) is another popular technique that provides topographical data at the nanoscale.
Spectroscopy Techniques
Raman spectroscopy and X-ray Photoelectron Spectroscopy (XPS) are used to determine the chemical composition and electronic states of nanomaterials. Fourier Transform Infrared Spectroscopy (FTIR) is employed to identify chemical bonds and molecular structures.
Scattering Techniques
Dynamic Light Scattering (DLS) and Small-Angle X-ray Scattering (SAXS) are techniques used to determine the size distribution and shape of nanoparticles in a suspension.

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