material characterization

What are the Common Techniques?

Several techniques are employed to characterize nanomaterials:

Microscopy Techniques
- Transmission Electron Microscopy (TEM): Provides high-resolution images of the internal structure.
- Scanning Electron Microscopy (SEM): Offers detailed surface images.
- Atomic Force Microscopy (AFM): Measures surface topography at atomic resolution.

Spectroscopy Techniques
- X-ray Diffraction (XRD): Determines the crystallographic structure.
- Raman Spectroscopy: Provides information on molecular vibrations.
- Fourier Transform Infrared Spectroscopy (FTIR): Identifies chemical bonds and molecular components.

Other Techniques
- Dynamic Light Scattering (DLS): Measures particle size distribution.
- Zeta Potential Analysis: Determines the surface charge of nanoparticles.

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