Several techniques are commonly used for nanoimaging, each with its unique advantages and applications:
Scanning Electron Microscopy (SEM) SEM uses focused beams of electrons to create detailed images of surfaces. It is widely used for its high resolution and depth of field.
Transmission Electron Microscopy (TEM) TEM involves transmitting electrons through a thin sample to create high-resolution images. It provides detailed information about the internal structure of nanomaterials.
Atomic Force Microscopy (AFM) AFM uses a cantilever with a sharp tip to scan the surface of a sample. It can provide three-dimensional images and measure forces at the nanoscale.
Scanning Tunneling Microscopy (STM) STM measures the tunneling current between a sharp tip and the sample surface to create atomic-scale images. It is particularly useful for conductive materials.
Near-Field Scanning Optical Microscopy (NSOM) NSOM uses near-field light to achieve resolutions beyond the diffraction limit of conventional optical microscopy. It is useful for imaging biological samples and other non-conductive materials.
