Several imaging techniques are commonly used in nanotechnology, including:
Scanning Electron Microscopy (SEM): Provides high-resolution images of the surface of nanomaterials. Transmission Electron Microscopy (TEM): Allows for the visualization of internal structures of nanomaterials at atomic resolution. Atomic Force Microscopy (AFM): Measures surface topography at the nanoscale by scanning a sharp probe over the sample surface. Scanning Tunneling Microscopy (STM): Provides atomic-scale images by measuring the tunneling current between a sharp tip and the sample surface. Raman Spectroscopy: Offers information on the molecular composition and structure through inelastic scattering of light.
