While in situ TEM offers many advantages, it also presents several challenges:
Sample Preparation: Preparing samples that can withstand the electron beam and the environmental conditions without significant damage. Instrumentation: Designing and maintaining specialized sample holders and ensuring their compatibility with the TEM system. Data Interpretation: Analyzing the complex and often noisy data obtained from in situ experiments requires advanced computational tools and expertise. Beam Damage: Minimizing the damage caused by the electron beam to avoid altering the sample's natural behavior.
