What are the Challenges in Measuring Thin Film Thickness?
Measuring thin film thickness at the nanoscale involves several challenges:
Surface Roughness: Variations in surface topography can affect measurement accuracy. Material Properties: Different materials interact with measurement techniques in various ways, complicating calibration. Environmental Factors: Conditions such as temperature and humidity can influence measurements. Layer Uniformity: Non-uniform films pose difficulties in obtaining consistent measurements across the substrate.
