Despite its advantages, the four point probe method faces several challenges in the context of nanotechnology. One of the main challenges is ensuring proper contact between the probes and the nanoscale sample. The alignment and pressure must be carefully controlled to avoid damaging the sample. Advanced techniques such as Atomic Force Microscopy (AFM) integrated with four point probes have been developed to overcome these issues. Another challenge is the interpretation of the data, which can be complex due to the unique properties of nanoscale materials. Advanced modeling and simulation tools are often employed to better understand the results.
